Radiation Vulnerability Analysis Using High Efficiency Compact Modeling

Radiation Vulnerability Analysis Using High Efficiency Compact Modeling

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The solution to these problems involves enhancement of the device models used to predict circuit performance to include charge-sharing SET effects. This in turn requires high-fidelity device models, charge-sharing SET models and finally an approach to utilize the models on the standard libraries of components of which integrated circuits are constructed.134- 138. [42] Y. Cheng and C. Hu, MOSFET Modeling aamp; BSIM3 Usera#39;s Guide, 1999. [43] W. Liu and Liu, MOSFET Models for SPICE Simulation Including BSIM3v3 and BSIM4, 2001. [44] Spectre Simulator Usera#39;s Guide, Cadence, Inc., 2008.


Title:Radiation Vulnerability Analysis Using High Efficiency Compact Modeling
Author: Anthony Matthew Francis
Publisher:ProQuest - 2009
ISBN-13:

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